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Structural investigation of complex surface interfaces by means of X-ray Photoelectron Diffraction
Zhan, Rongrong
2012-03-28
Contributor(s)
Vesselli, Erik
Abstract
The goal of this dissertation is to explain how the X-ray photoelectron diffraction technique can be successfully employed in the structural investigation of complex surface interfaces of ultra-thin films. Local geometrical analysis, combined with other techniques that gain additional electronic and surface morphological information to the system investigated, shed light on those extremely complicated surface atomic systems. These studies are aimed to contribute to the many interesting applications in fields like nano-electronics, surface coating and magnetic storage devices.
Insegnamento
Publisher
Università degli studi di Trieste
Languages
en
File(s)