Please use this identifier to cite or link to this item: http://hdl.handle.net/10077/7447
Title: Structural investigation of complex surface interfaces by means of X-ray Photoelectron Diffraction
Authors: Zhan, Rongrong
Keywords: Ultra-thin filmsX-ray Photoelectron Diffractioninterface
Issue Date: 28-Mar-2012
Publisher: Università degli studi di Trieste
Abstract: The goal of this dissertation is to explain how the X-ray photoelectron diffraction technique can be successfully employed in the structural investigation of complex surface interfaces of ultra-thin films. Local geometrical analysis, combined with other techniques that gain additional electronic and surface morphological information to the system investigated, shed light on those extremely complicated surface atomic systems. These studies are aimed to contribute to the many interesting applications in fields like nano-electronics, surface coating and magnetic storage devices.
Description: 2010/2011
URI: http://hdl.handle.net/10077/7447
NBN: urn:nbn:it:units-9151
Appears in Collections:Scienze fisiche

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